Secondary ion mass spectrometry : SIMS X : Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X) : University of Muenster, Muenster, Germany October 1-6th, 1995

Partial table of contents: PLENARY LECTURES Biosurfaces: A Communications Link Between Solids and Cells (B. Ratner) INVITED LECTURES Cluster Emission in Sputtering (A. Wucher & M. Wahl) IMAGING Analysis of an LCD Device by SIMS (T. Yamamoto, et al.) SPUTTERING AND ION FORMATION Competitive Oxygen Enhancement (E. Brown & P. Williams) DATA PROCESSING SIMS - On the Internet (R. Lareau, et al.) DEPTH PROFILING Depth Resolution Parameters and Separability (M. Dowsett) SURFACE ANALYSIS The Characterization of Fluorolubricants on 8mm Video Tape by TOF-SIMS (T. Hoshi & M. Tozu) SEMICONDUCTORS/MICROELECTRONICS Altered Layer Formation in SiGe (W. De Coster, et al.) MOLECULAR OVERLAYERS Combined SXM/SIMS Investigation of Damage Effects in Molecular Overlayers (G. Becker, et al.) QUANTIFICATION Statistical Process Control (SPC) for SIMS (R. Hockett, et al.) ORGANIC MATERIAL/POLYMERS TOF-SIMS Analysis of a Bio-Polymer (F. Lang, et al.) POSTIONIZATION Quantification of B and As Depth Profiles with Resonant Post-Ionisation Mass Spectrometry (P. De Bisschop, et al.) LIFE SCIENCES Determination of Cyclosporine Metabolites by TOF-SIMS (K. Meyer, et al.) MATERIAL SCIENCES SIMS Analysis of Nitrided Iron and Steel (T. Wu, et al.) MISCELLANEOUS Detection of Mineral Collectors by TOF-LIMS (S. Chryssoulis, et al.) COMBINED TECHNIQUES Quantification and Standardization of LIMS Analysis of Mineral Surfaces (S. Dimov & S. Chryssoulis) MOLECULAR SIMS: ION FORMATION Images of Biologic Tissue Beyond the Static SIMS Limit (P. Todd, et al.) MOLECULAR SIMS: APPLICATIONS Imaging of Langmuir Blodgett Layers by TOF-SIMS (H. Rulle, et al.) INSTRUMENTATION A New Setup for Accelerator-SIMS (R. Ender, et al.).