Strategies to determine failure mechanism of devices that recovered during analysis
作者
Lin Tan,Chiew-Ing Liew,Akeel Nazakat,Jethro Tan,W. F. Kho
标识
DOI:10.1109/ipfa.2016.7564327
摘要
Occurrences of failure recovery in the course of failure analysis work are not uncommon. Despite this, successful identification of the failure mechanism is still possible in some cases based on available data up to the point of failure recovery, circuit layout knowledge and a combination of a few conventional failure analysis techniques.