单层
介电谱
自组装单层膜
电容
电阻式触摸屏
材料科学
吸附
电阻抗
纳米技术
电化学
化学
光电子学
物理化学
电极
电气工程
工程类
作者
M. Jalal Uddin,M. Khalid Hossain,Mohammad Ismail Hossain,Wayesh Qarony,Shahzadi Tayyaba,M.N.H. Mia,M.F. Pervez,Sarwar Hossen
标识
DOI:10.1016/j.rinp.2017.06.055
摘要
This work proposes a modeling of self-assembled monolayers (SAMs) to assess the quality of SAM layers in terms of their leaky behavior. In the modeling, electrochemical impedance spectroscopy (EIS) and a conceptual and simplified resistance-resistance-capacitance (RRC) electrical model from an electrochemical setup were demonstrated. Based on the model, Matlab-based simulation was carried out to find out the suggestive low frequency measurement for analyzing the defective monolayers. Finally, the developed electrical model facilitated the interpretation of the EIS spectra measured in the range of 10 Hz to 100 kHz and provided the capacitance, resistance and thickness of the monolayer. Thus the proposed model could be considered as a powerful tool to characterize the defective SAMs, which was very specific to determine the resistive behavior of the self-assembled monolayers prepared for shorter adsorption time.
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