捷克先令
化学计量学
退火(玻璃)
猝灭(荧光)
材料科学
化学成分
电导率
热力学
化学
纳米技术
冶金
物理
物理化学
薄膜
量子力学
荧光
作者
V. Kosyak,A. V. Postnikov,Jonathan J. Scragg,Michael A. Scarpulla,Charlotte Platzer‐Björkman
摘要
Herein, we study the native point defect equilibrium in Cu2ZnSnS4 (CZTS) by applying a statistical thermodynamic model. The stable chemical-potential space (SCPS) of CZTS at an elevated temperature was estimated directly, on the basis of deviations from stoichiometry calculated for the different combinations of chemical potential of the components. We show that the SCPS is narrow due to high concentration of VCu−−ZnCu+ complex which is dominant over other complexes and isolated defects. The CZTS was found to have p-type conductivity for both stoichiometric and Cu-poor/Zn-rich composition. It is established that the reason for this is that the majority of donor-like ZnCu+ antisites are involved in the formation of VCu−−ZnCu+ complex making CuZn− dominant and providing p-type conductivity even for Cu-poor/Zn-rich composition. However, our calculation reveals that the hole concentration is almost insensitive to the variation of the chemical composition within the composition region of the single-phase CZTS due to nearly constant concentration of dominant charged defects. The calculations for the full equilibrium and quenching indicate that hole concentration is strongly dependent on the annealing temperature and decreases substantially after the drastic cooling. This means that the precise control of annealing temperature and post-annealing cooling rate are critical for tuning the electrical properties of CZTS.
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