硅
外延
动力学
材料科学
化学工程
光电子学
化学
纳米技术
工程类
物理
量子力学
图层(电子)
作者
Ananya Renuka Balakrishna,J.M. Chacin,Paul B. Comita,Benedikt Haas,P Shing Ho,A. Thilderkvist
出处
期刊:U.S. Department of Energy Office of Scientific and Technical Information - OSTI OAI
日期:1998-11-24
被引量:16
摘要
A reaction mechanism has been developed that describes the gas-phas 0971 and surface reactions involved in the chemical vapor deposition of Si from chlorosilanes. Good agreement with deposition rate data from a single wafer reactor with no wafer rotation has been attained over a range of gas mixtures, total flow rates, and reactor temperatures.
科研通智能强力驱动
Strongly Powered by AbleSci AI