溶剂化
还原(数学)
化学
密度泛函理论
隐溶剂化
溶剂化电子
分子
集合(抽象数据类型)
计算化学
有机分子
统计物理学
基准集
计算物理学
传输(计算)
基础(线性代数)
溶剂化壳
近似误差
生物系统
计算机科学
材料科学
算法
热力学
作者
Christian Sandoval-Pauker,Thomas P Senftle
标识
DOI:10.1021/acs.jpca.5c04688
摘要
Standard reduction potentials (E0) describe the tendency of a species to be reduced or oxidized, playing an important role in determining electron transfer thermodynamics and kinetics. Different solvation models are available for the computational prediction of E0 values, such as SMD/COSMO-RS for atom-centered DFT codes versus VASPsol/VASPsol++ for plane-wave DFT codes. In this study, we evaluate the performance of relatively new solvation models implemented in plane-wave DFT codes (VASPsol and VASPsol++), as compared to more established methods often implemented in atom-centered DFT codes (SMD and COSMO-RS). We compute the standard reduction potentials for a set of 56 chemically diverse organic molecules in acetonitrile. The atom-centered methods show mean absolute errors (MAEs) ranging from 0.19 to 0.36 V. VASPsol delivered comparable performance to the majority of atom-centered methods (MAE = 0.37-0.39 V). VASPsol++ achieved improved accuracy with MAE values between 0.18 and 0.19 V. We also tested the accuracy of VASPsol and VASPsol++ for ten additional organic molecules in protic media (H2O), achieving MAE values of 0.19 and 0.12 V, respectively. These results highlight that a unified plane-wave DFT approach, employing VASPsol or the enhanced VASPsol++ protocol, can be used to calculate both standard reduction potentials of solvated species, as well as band edge alignments at aqueous-solid interfaces.
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