材料科学
兴奋剂
金属
氧化物
薄膜
氧化铁
纳米技术
凝聚态物理
工程物理
化学物理
冶金
光电子学
物理
作者
Ahmed A. Aboud,Zinab S Matar,M. A. Mohaseb
出处
期刊:Physica Scripta
[IOP Publishing]
日期:2024-10-07
卷期号:99 (11): 115926-115926
被引量:1
标识
DOI:10.1088/1402-4896/ad7dba
摘要
Abstract This study investigates the physical properties of pure and Co, Cr, Mn, and Ni-doped Fe 2 O 3 thin films fabricated using spray pyrolysis techniques on glass substrates. The primary aim is to understand how doping influences the structural, optical, and dielectric properties of Fe 2 O 3 thin films. The deposition parameters were kept constant for all samples, with a fixed dopant concentration of 3 weight percent (wt%). X-ray diffraction (XRD) analysis revealed a single diffraction peak indexed as (104), decreasing in crystallite size from 17.27 nm for the pure film to approximately 11.5 nm for all doped films. Field emission scanning electron microscopy (FE-SEM) images displayed non-homogeneous grain formation, characterized by an average grain size larger than the crystallite size, indicating agglomeration. The optical band gap value shifted from 2.54 eV for the pure film to higher values upon doping with various elements, signifying direct allowed transitions. Changes in refractive index dispersion with wavelength were observed based on the dopant type. The application of the Spitzer-Fan model revealed an increase in high-frequency dielectric constant upon doping compared to the pure film, varying across different dopants. Photoluminescence (PL) spectra recorded under excitation at 340 nm exhibited multiple emission peaks within the spectral range of 399 to 600 nm.
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