电容器
材料科学
可靠性(半导体)
基质(水族馆)
光电子学
薄膜
陶瓷电容器
热冲击
电气工程
计算机科学
电子工程
电压
复合材料
纳米技术
工程类
物理
功率(物理)
海洋学
量子力学
地质学
作者
Hironori Tanaka,Takashi Kariya Hiroyasu Nagata,Kazuhiro Yoshikawa,Keisuke Shimizu,Hidetoshi Noguchi,Shinobu KATO
标识
DOI:10.1109/eptc.2008.4763558
摘要
We successfully embedded this thin film capacitor in a conventional plastic-type build-up PKG substrate. The unique thin film capacitor consists of Perovskite-type ceramics sanded by metal electrodes, using thin film process technology. The total thickness is less than 1 um with extremely high permittivity, more than 1 uF/cm 2 .; the resulting PKG substrate shows short free including capacitor/electrode potions, and the embedded area is more than 10 mm 2 . The capacitor embedded package substrate has the same appearance as a commonly used conventional LSI package, and the same assembling technique can be applied for flip chip mounting of LSI. The capacitor embedded package shows small impedance values at high frequency area, and thus, exhibits excellent performance against high frequency operated system. This study also includes reliability evaluation of the capacitor embedded package. There is no issue in mechanical reliability evaluation, thermal shock etc., although a little more improvement is still required in high voltage bias test during high humidity reliability. The developed technology and materials are expected for next generation high speed frequency LSI package fabrications.
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