材料科学
同步辐射
准直光
衍射
同步加速器
粉末衍射
X射线晶体学
X射线
光学
分辨率(逻辑)
辐射
结晶学
激光器
物理
计算机科学
人工智能
化学
出处
期刊:Solid State Phenomena
日期:2007-12-01
卷期号:130: 7-14
被引量:4
标识
DOI:10.4028/www.scientific.net/ssp.130.7
摘要
The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.
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