欧姆接触
半金属
接触电阻
肖特基势垒
材料科学
半导体
纳米电子学
场效应晶体管
异质结
纳米技术
光电子学
碳纳米管
石墨烯
凝聚态物理
晶体管
带隙
物理
二极管
电压
量子力学
图层(电子)
作者
Xuanzhang Li,Wei Yang,Zhijie Wang,Ya Kong,Yipeng Su,Gaotian Lu,Zhen Mei,Yi Su,Guangqi Zhang,Jianhua Xiao,Liang Liang,Jia Li,Qunqing Li,Jin Zhang,Shoushan Fan,Yuegang Zhang
标识
DOI:10.1038/s41467-022-35760-x
摘要
Abstract Two-dimensional (2D) semiconductors are promising in channel length scaling of field-effect transistors (FETs) due to their excellent gate electrostatics. However, scaling of their contact length still remains a significant challenge because of the sharply raised contact resistance and the deteriorated metal conductivity at nanoscale. Here, we construct a 1D semimetal-2D semiconductor contact by employing single-walled carbon nanotube electrodes, which can push the contact length into the sub-2 nm region. Such 1D–2D heterostructures exhibit smaller van der Waals gaps than the 2D–2D ones, while the Schottky barrier height can be effectively tuned via gate potential to achieve Ohmic contact. We propose a longitudinal transmission line model for analyzing the potential and current distribution of devices in short contact limit, and use it to extract the 1D–2D contact resistivity which is as low as 10 −6 Ω·cm 2 for the ultra-short contacts. We further demonstrate that the semimetal nanotubes with gate-tunable work function could form good contacts to various 2D semiconductors including MoS 2 , WS 2 and WSe 2 . The study on 1D semimetal contact provides a basis for further miniaturization of nanoelectronics in the future.
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