抛光
材料科学
表面粗糙度
蚀刻(微加工)
表面光洁度
光学玻璃
复合材料
光学材料
光学
光电子学
物理
图层(电子)
作者
P. Paul Hed,David F. Edwards,J.B. Davis
摘要
The detection, measurement and removal of subsurface damage is a major effort of the LLNL Optical Sciences and Engineering Group. We will describe and show examples of three methods we are currently using to detect and measure the depth of damage in glasses and crystalline materials: taper polishing and etching, constancy of chemical etch rate, and small specimen fracture. In addition, results will be given to show that the depth of damage can often be approximated from the surface roughness and Young's modulus.
科研通智能强力驱动
Strongly Powered by AbleSci AI