准晶
斐波纳契数
衍射
包络线(雷达)
结构因子
傅里叶变换
二十面体对称
反向
相(物质)
曲面(拓扑)
功能(生物学)
物理
数学
数学分析
统计物理学
光学
材料科学
几何学
凝聚态物理
量子力学
计算机科学
组合数学
进化生物学
生物
电信
雷达
作者
Radosław Strzałka,Łukasz Chuchra,Janusz Wolny
出处
期刊:Crystals
[Multidisciplinary Digital Publishing Institute]
日期:2022-04-11
卷期号:12 (4): 536-536
标识
DOI:10.3390/cryst12040536
摘要
Quasicrystals have attracted a growing interest in material science because of their unique properties and applications. Proper determination of the atomic structure is important in designing a useful application of these materials, for which a difficult phase problem of the structure factor must be solved. Diffraction patterns of quasicrystals consist of a periodic series of peaks, which can be reduced to a single envelope. Knowing the distribution of the diffraction image into series, it is possible to recover information about the phase of the structure factor without using time-consuming iterative methods. By the inverse Fourier transform, the structure factor can be obtained (enclosed in the shape of the average unit cell, or atomic surface) directly from the diffraction patterns. The method based on envelope function analysis was discussed in detail for a model 1D (Fibonacci chain) and 2D (Penrose tiling) quasicrystal. First attempts to apply this technique to a real Al-Cu-Rh decagonal quasicrystal were also made.
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