Improvement in electrical conductivity characterization of chitosan/Poly (ethylene oxide) incorporated with V2O5 NPs via laser ablation

One-potential laser ablation of pure vanadium plate immersed in chitosan-PEO (50/50 wt. %) solution to get (chitosan-PEO) filled directly by V2O5 NPs. The casting process was used to make chitosan-PEO/V2O5 NPs composite films. X-ray diffraction (XRD), ultraviolet–visible spectra (UV–Vis), scanning electron microscopy (SEM), and Ac conductivity were used to investigate the effect of various periods of laser ablation on the properties of the synthesized chitosan-PEO/V2O5 NPs films. XRD and SEM confirm V2O5 NPs and chitosan-PEO matrix complexation. XRD results represent significant diffraction peaks at 15.7°, 20.4°, and 26.3° that attributed to the incorporation of vanadium oxide nanoparticles in chitosan-PEO. V2O5 NPs were obtained to have an average crystal size equal to 23.3 ± 0.56 nm for 7 min and equal to 23.3 ± 0.94 for 12 min. After doping the chitosan-PEO matrix with V2O5 NPs, the direct and indirect optical bandgaps exhibit a decrease in its values. ε′ and ε′′ is very high in the low frequency then decrease with increase the frequency. Also, we found that both (ε′) and (ε′′) at low frequencies is very high for the produced pure chitosan-PEO blend and by the incorporation with V2O5 NPs it decreased by raising the laser ablation times. (σac') and (σac'') are is constant in the low frequency then (σac') increase and (σac'') decrease with increase the frequencies.