拉曼光谱
材料科学
薄膜
光电子学
工程物理
纳米技术
光学
工程类
物理
作者
Vijay C. Karade,Mahesh P. Suryawanshi,Jun Sung Jang,Kuldeep Singh Gour,Suyoung Jang,Jongsung Park,Jin Hyeok Kim,Seung Wook Shin
摘要
The Raman analysis of Cu 2 ZnSn(S,Se) 4 thin films revealed a change in the relative defect concentration and device performance with composition.
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