材料科学
纳米尺度
单斜晶系
金属-绝缘体过渡
蛋白质丝
衍射
相变
钒
电阻率和电导率
薄膜
相(物质)
金红石
凝聚态物理
纳米技术
金属
复合材料
结晶学
晶体结构
化学
光学
冶金
工程类
物理
有机化学
电气工程
作者
Eugene Freeman,Greg Stone,Nikhil Shukla,Hanjong Paik,Jarrett A. Moyer,Zhonghou Cai,Haidan Wen,Roman Engel‐Herbert,Darrell G. Schlom,Venkatraman Gopalan,Suman Datta
摘要
The structural evolution of tensile strained vanadium dioxide thin films was examined across the electrically driven insulator-to-metal transition by nanoscale hard X-ray diffraction. A metallic filament with rutile (R) structure was found to be the dominant conduction pathway for an electrically driven transition, while the majority of the channel area remained in the monoclinic M1 phase. The filament dimensions were estimated using simultaneous electrical probing and nanoscale X-ray diffraction. Analysis revealed that the width of the conducting channel can be tuned externally using resistive loads in series, enabling the M1/R phase ratio in the phase coexistence regime to be tuned.
科研通智能强力驱动
Strongly Powered by AbleSci AI