Progress and future challenges of silicon carbide devices for integrated circuits
作者
Tsunenobu Kimoto
出处
期刊:日期:2014-09-01卷期号:: 1-8被引量:11
标识
DOI:10.1109/cicc.2014.6946035
摘要
Silicon carbide (SiC) is an emerging wide bandgap semiconductor having superior physical properties such as high critical electric field and high saturated drift velocity. Discrete high-voltage, low-loss SiC power devices such as 600-1700 V Schottky barrier diodes and FETs (MOSFETs and JFETs) have currently been developed, and small-scale production has started. SiC is also attractive for advanced integrated circuits operating in high-temperature and radiation-hard circumstances. This paper reviews the present status, future prospects, and technological challenges of SiC devices and circuits.