反射型
化学
质谱法
分析化学(期刊)
飞行时间质谱
飞行时间
离子
原子物理学
分析器
溅射
朗缪尔探针
离子源
分辨率(逻辑)
等离子体
航程(航空)
等离子体诊断
电离
核物理学
物理
材料科学
薄膜
纳米技术
复合材料
计算机科学
人工智能
有机化学
色谱法
作者
Malte Watzek,Patrick Sturm,Carsten Stoermer,A. Bensaoula,Thomas Nelis,Caroline Hain
标识
DOI:10.1021/jasms.4c00140
摘要
This work presents a newly designed energy-resolving time-of-flight mass spectrometer (E-TOFMS) for analysing the energy and mass of ions in bulk plasma. The system comprises an electrostatic sector analyser (ESA) for energy-to-charge (E/Q) ratio resolution and an orthogonal reflectron TOFMS for mass-to-charge (m/Q) ratio analysis. The design choices are explained, providing insight into electron and ion path simulations. The instrument was characterised using various ion generation sources, including an electron impact ion source, high power impulse magnetron sputtering, and microwave plasma electron cyclotron resonance sources. To validate its functionality, the energy-resolving data was compared with data obtained under the same conditions using a Langmuir probe and a retarding field energy analyser (RFEA). The benefits of the proposed E-TOFMS were demonstrated by sputtering highly alloyed steel with multiple isotope-rich elements, such as Mo or W. This technique offers an E/Q ratio resolution of up to 0.15 V for a range up to 125 V and a m/Q ratio resolution of at least 700 Th for a range up to 250 Th, with a temporal resolution of 10 μs.
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