Optical and Structural Characterization of Zno Thin Films Upon Ion Beam Assisted Smoothing

Wurtzite ZnO has a preferential growth direction along the c-axis of the hexagonal unit cell, which, especially in combination with underlying (amorphous) heterostructures, can lead to a high surface roughness for the ZnO layers. This poses a significant challenge to the construction of e.g. photonic waveguides or gratings. Here, we propose an efficient way for smoothing ZnO surfaces after deposition using a collimated beam of Argon ions, that allows to avoid wet-chemical processes for the highly reactive ZnO. Furthermore, the influence of this treatment at different angles of incidence and fluence of the ions on the morphological, structural and linear optical emission properties is investigated using atomic force microscopy, X-Ray diffraction, spectroscopic ellipsometry and photoluminescence experiments. Our results suggest that using an ion beam incident at an angle of 85° reduces the surface roughness by around 70 % while keeping the ZnO crystal structure intact. Though such a treatment leads to a reduced intensity and to a broadening of the PL-emission, excitonic transitions are still prominently observable.