记忆电阻器
锡
光电子学
材料科学
抗辐射性
横杆开关
辐射
氮化物
电阻式触摸屏
非易失性存储器
中子
数码产品
纳米技术
电气工程
光学
物理
冶金
核物理学
工程类
图层(电子)
作者
Yanming Zhang,Ge Tang,Peng Feng,Kaijin Kang,Xiaosheng Tang,Mo Li,Wei Hu
摘要
A memristor is promising as an electronic synapse or next-generation nonvolatile memory, and its radiation resistance has recently received extensive attention for broader application fields. We fabricated Al/AlN/TiN crossbar arrays and investigated their resistive switching properties and neutron radiation-resistant performance. Al/AlN/TiN memory devices have many excellent features, such as operating currents down to 10 μA, memory endurance over 120 cycles, resistance window greater than 104, and retention time in excess of 104 s. More importantly, the memory devices with different resistance states still maintain remarkable resistive switching behaviors after irradiating with a dose of neutron radiation up to 1 × 1014 n/cm2, demonstrating outstanding potential application in radiation-resistant electronics.
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