材料科学
铁电性
非易失性存储器
钙钛矿(结构)
铋铁氧体
光电子学
制作
纳米技术
晶体管
二硫化钼
场效应晶体管
铁电电容器
铋
铁氧体(磁铁)
薄膜
功率消耗
泄漏(经济)
切换时间
兴奋剂
矫顽力
硅
热电性
作者
Tianqing Wan,Yiping Xiao,Zhihang Xu,Chaoyi Zhu,Jian‐Min Yan,Houji Zhou,Jialiang Wang,Sijie Ma,Hongye Chen,Zhengdao Xie,Yi Li,Ye Zhu,Yuefeng Nie,Dianxiang Ji,Yang Chai
出处
期刊:ACS Nano
[American Chemical Society]
日期:2025-10-10
卷期号:19 (41): 36313-36322
被引量:3
标识
DOI:10.1021/acsnano.5c09313
摘要
Data-centric applications demand low-power and compact memory solutions. Ferroelectric field-effect transistors (FeFETs) are promising candidates due to the high energy efficiency of ferroelectric switching and the elimination of selectors. However, ferroelectric materials that simultaneously demonstrate a low switching energy and compatibility with FeFET fabrication processes remain limited. In this work, we show that the transferable perovskite ferroelectric bismuth ferrite (BiFeO3) with high crystal quality can be integrated with two-dimensional materials to realize low-power FeFETs. The transferred BiFeO3 films exhibit a coercive field of 30 kV/cm and a leakage current of under 10-5 A/cm2 (at 1 MV/cm), resulting in a switching energy of 0.05 J/cm3. Leveraging the high-quality interface between transferred BiFeO3 with molybdenum disulfide (MoS2), we fabricate two types of FeFETs: a metal-ferroelectric-semiconductor (MFS) structure showing volatile memory and a metal-ferroelectric-metal-insulator-semiconductor (MFMIS) structure showing nonvolatile memory. Both device architectures exhibit low power consumption (1.5 fJ bit-1 μm-2 for MFS and 11.2 fJ bit-1 μm-2 for MFMIS). Utilizing these volatile and nonvolatile FeFETs, we constructed a low-power, compact, and all-FeFET computing system for pattern classification tasks, highlighting the potential of transferable BiFeO3 for low-power memory and computing systems.
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