计算机科学
错误检测和纠正
元数据
Reed–Solomon错误更正
计算机工程
算术
嵌入式系统
计算机硬件
并行计算
解码方法
算法
线性码
区块代码
操作系统
数学
作者
Evgeny Manzhosov,Adam Hastings,Meghna Pancholi,Ryan Piersma,Mohamed Tarek Ibn Ziad,Simha Sethumadhavan
出处
期刊:IEEE Micro
[Institute of Electrical and Electronics Engineers]
日期:2023-05-10
卷期号:43 (4): 53-61
被引量:1
标识
DOI:10.1109/mm.2023.3273489
摘要
This article shows how residue codes, traditionally used for compute rather than storage error correction, can be applied to memories with surprising results. We show that adapting residue codes to modern memory systems offers a level of error correction comparable to those of traditional schemes, such as Reed–Solomon, but with fewer bits of storage. For instance, our adaptation of residue codes—multiuse error-correcting code (MUSE ECC)—can offer ChipKill protection using approximately 30% fewer bits. We use the storage gains to hold the metadata needed for emerging security functionality, such as memory tagging, or to provide better detection capabilities against Rowhammer attacks. In a system with memory tagging and MUSE, we achieve a 12% reduction in memory bandwidth utilization with the same error correction level as a traditional ECC baseline and without a noticeable performance loss. Thus, our work demonstrates a new, flexible primitive for co-designing reliability with security and performance.
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