Advances in Transmission Electron Microscopy to Image Nanocrystals

Recent advancements in transmission electron microscopy (TEM) have substantially expanded our capability to observe nanocrystals at unprecedented spatial and temporal resolutions. Innovations in TEM instruments, specimen preparation, and imaging modality have overcome historical limitations related to radiation damage, weak contrast for light elements, 2D projection limitations, and high-vacuum constraints. Additionally, advanced image processing techniques, particularly those incorporating machine learning, have enhanced data interpretation by enabling denoising, segmentation, and quantitative analysis. These advancements now enable the atomic-scale visualization of structural motifs, defects, strain distributions, and dynamic structural transformations of nanocrystals in realistic environments, including liquids and gases. The integration of these emerging TEM techniques promises novel insights into nanoscale processes that directly link atomic structure and dynamics to functional properties, thus significantly advancing the ultimate goal of materials by design.