钙钛矿(结构)
X射线光电子能谱
卤化物
锡
材料科学
惰性
化学稳定性
氧化物
光谱学
光电发射光谱学
薄膜
氧化锡
化学物理
化学状态
无机化学
串联
化学工程
扩散
纳米技术
溅射
表面改性
化学种类
化学
图层(电子)
作者
Juntao Hu,Dengke Wang,Yan Shi,Nisar Ahmad,Mulin Sun,Yanning Wang,Hannan Yang,Dongming Zhang,Qin Hu,Deying Luo,Zheng‐Hong Lu
标识
DOI:10.1021/acs.jpclett.5c02055
摘要
Tin-containing halide perovskites are promising for tandem solar cells but face stability issues due to tin oxidation, even under low-oxygen conditions. A comprehensive understanding of the tin chemical states at the surface and within the bulk after oxidation is essential for developing strategies to mitigate tin oxidation. In this study, we investigate the nature and evolution of oxidation products near the surface of tin-containing perovskites using X-ray photoelectron spectroscopy (XPS) and gas-cluster ion-beam (GCIB) sputter profiling. We demonstrate that peaks previously attributed to Sn 2+ and Sn 4+ are now reassigned to Sn 2+ (-I) and Sn x + (-O), respectively, with a thin Sn oxide layer formed on the perovskite surface. Under inert conditions, Sn x + and O species do not penetrate the bulk but significantly alter the Sn/Pb and I/(Sn+Pb) ratios. Furthermore, Sn diffusion from the bulk to the surface occurs alongside the A-site cation (N species and Cs + ) and iodine depletion, even without external stimuli. These findings provide critical insights into the complex interplay between tin’s oxidation states and the stability of tin-based perovskite solar cells.
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