作者
Xiaoli Li,Zhaoshui Yu,Jinli Xu,Yanshan Pan,Bo Wei,Bin Liu,Pengpeng Zhang,Jinfeng Bai,Qin Zhang
摘要
Abstract The method of determination of major (Si, Al, Fe, Mg, Ca, Na, K, Mn, P, Ti) and trace elements (As, Ba, Br, Ce, Cl, Co, Cr, Cu, F, Ga, Nb, Sr, La, Ni, Pb, Rb, S, U, Th, V, Y, Zn, Zr) in geochemical samples by wavelength dispersive X‐ray fluorescence spectrometer with a new sample preparation technique‐high pressure pressed pellet and covered with a 3.6 μm polyester film is proposed. The pellet was pressed at 2,000 kN, which was particularly meaningful for the sample with high silicon content and ideal pellet was formed without binder. Coating with a polyester film prevented the variation of chlorine content after multiple analyses of the same pellet, which was caused by the vacuum and long‐time irradiation. And 62 rock, soil and sediment reference materials were applied to create calibration curves. The accuracy of the method was evaluated with another eight certified reference materials that were not used in the regression curve. In most cases, the relative error between the certified value and the calculated value was <10% for major elements and <25% for trace elements, except for those approaching the limit of detection. The limit of detection obtained using this pellet preparation technology is suitable for geochemical analyses.