About the Lorentz correction used in the interpretation of small angle X‐ray scattering data of semicrystalline polymers

Abstract Lorentz correction is used to correct the intensities of X‐ray scattering of single crystal diffractometry in order to recalculate intensities to obtain structure factors. This correction reduces the intensities to zero at zero diffraction angle. Small angle scattering is used to study the dimensions of heterogeneities in polymeric materials. The scattering intensities near to zero scattering angle originate partly from periodic systems (reciprocal lattice) and partly from dispersed particle systems. Periodic systems should result in individual Gaussian or Lorentzian peaks with the position of a peak maximum depending on the length of the periodicity. Particle scattering results in a Gaussian peak centred at zero scattering angle. The effect of the Lorentz correction on the interpretation of small angle X‐ray scattering data is shown in the case of some semicrystalline polyethylenes (high density, linear low density, and low molecular weight waxy polyethylenes). The data are compared with those for amorphous block copolymers (styrene/butadiene) in which there is a periodic system with homogeneous lamellar thickness. Lorentz correction destroys the characteristics of the particle scattering and can be applied only for periodic systems. It should not be used to produce a peak on scattering data which does not show periodicity (peaks) without correction. © 2001 John Wiley & Sons, Inc. J Appl Polym Sci 80: 2300–2308, 2001