光伏系统
降级(电信)
钙钛矿(结构)
偏压
光电子学
太阳能电池
材料科学
电压
电致发光
晶体硅
开路电压
基质(水族馆)
硅
PID控制器
电子工程
化学工程
纳米技术
电气工程
工程类
图层(电子)
温度控制
海洋学
地质学
控制工程
作者
Kristijan Brecl,Matthias Jost,Matevž Bokalič,Jernej Ekar,Janez Kovač,Marko Topič
出处
期刊:Solar RRL
[Wiley]
日期:2021-12-19
卷期号:6 (2)
被引量:13
标识
DOI:10.1002/solr.202100815
摘要
Potential‐induced degradation (PID) is a solar cell‐related degradation mechanism due to high potential difference in a photovoltaic (PV) module between the solar cells and its grounded frame. This type of degradation is well known for silicon PV; however, for perovskites it has not been thoroughly researched yet. Herein, the PID of perovskite solar cells is investigated for bias voltages of ±500 V, half of the currently used system voltage, and ±1000 V with regular I–V and electroluminescence measurements during the test. The devices show a high PID resistance under applied bias of ±500 V, far exceeding the recommended guidelines for silicon PV. However, for the bias voltage of –1000 V a rapid degradation is observed due to the ingress of sodium ions from the glass substrate as confirmed by the time‐of‐flight secondary ion mass spectrometry measurements of spatial and depth distribution of elements in solar cells. Positively biased devices show no degradation due to high voltage exposure. These results show promising signs that perovskite solar cells are PID proof for current PV system designs.
科研通智能强力驱动
Strongly Powered by AbleSci AI