材料科学
晶体管
掺杂剂
CMOS芯片
单斜晶系
场效应晶体管
电容
正交晶系
光电子学
电气工程
阈值电压
化学
兴奋剂
电压
结晶学
电极
工程类
物理化学
晶体结构
作者
Chun‐Hu Cheng,Chia‐Chi Fan,Chun-Yuan Tu,Hsiao‐Hsuan Hsu,Chun‐Yen Chang
标识
DOI:10.1109/ted.2018.2881099
摘要
For the first time, we successfully demonstrated the dopant-free HfO 2 negative capacitance (NC) transistor featuring a low gate-overdrive voltage and a nearly hysteresis-free sub-40 mV/dec swing. These excellent performances can be ascribed to the reduction of the monoclinic phase suppressed with the thickness scaling and gate stress engineering favorably rearranging oxygen vacancies to boost orthorhombic phase transition. The highly scalable and dopant-free NC transistor shows the potential for the application of advanced CMOS technology.
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