Comment on “Restoration of the original depth distribution from the SIMS profile using the depth resolution function in framework of RMR model” [J. Vac. Sci. Technol. B 41, 024003 (2023)]

This comment is a summary of scientifically evident shortcomings of the so-called recoil-mixing-roughness (RMR)-model proposed in several publications by Kudriavtsev et al. in order to describe the formation of sputter depth profiles of concentration.