氧化物
材料科学
解耦(概率)
氧气
电化学
格子(音乐)
阴极
析氧
化学物理
过渡金属
纳米技术
电极
物理化学
化学
物理
催化作用
冶金
控制工程
声学
工程类
生物化学
量子力学
作者
Ning Li,Sooyeon Hwang,Meiling Sun,Yanbao Fu,Vincent Battaglia,Dong Su,Wei Tong
标识
DOI:10.1002/aenm.201902258
摘要
Abstract Extensive efforts have been devoted to unraveling the true cause of voltage decay in Li, Mn‐rich layered oxides. An initial consensus was reached on structural rearrangement, then leaned toward the newly discovered lattice oxygen activity. It is challenging to differentiate their explicit roles because these events typically coexist during the electrochemical reaction of most Li‐rich layered oxides. Here, the voltage decay behavior is probed in Li 1.2 Ni 0.2 Ru 0.6 O 2 , a structurally and electrochemically relevant compound to Li, Mn‐rich layered oxide, but of no oxygen activity. Such intriguing characteristics allow the explicit decoupling of the contribution of transition metal migration and lattice oxygen activity to voltage decay in Li‐rich layered oxides. The results demonstrate that the microstructural evolution, mainly originating from transition metal migration, is a direct cause of voltage decay, and lattice oxygen activity likely accelerates the decay.
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