薄膜
拉曼光谱
材料科学
光谱学
扫描电子显微镜
分析化学(期刊)
光致发光
基质(水族馆)
衍射
带隙
光学
化学
纳米技术
光电子学
复合材料
物理
海洋学
量子力学
地质学
色谱法
作者
Martina Gilić,Marko D. Petrović,B. Hadžić,M. Romčević,J. Trajić,N. Romčević,Zorica Ž. Lazarević
出处
期刊:Atlantis Press eBooks
[Atlantis Press]
日期:2017-01-01
卷期号:: 235-256
标识
DOI:10.2991/978-94-6239-213-7_18
摘要
This paper describes the structural and optical properties of Cu-Se-CuSe2 thin films. The surface morphology of thin films was investigated by atomic force microscopy (AFM) and scanning electron microscopy (SEM). Formation of thin films is concluded to proceed unevenly, in the form of islands which later grew into agglomerates. The structural characterization of Cu-Se-CuSe2 thin film was investigated using X-ray diffraction pattern (XRD). The presence of two-phase system is observed. One is the solid solution of Cu in Se and the other is low-pressure modification of CuSe2. The Raman spectroscopy was used to identify and quantify the individual phases present in the films. Red shift and asymmetry of Raman mode characteristic for CuSe2 enable us to estimate nanocrystal dimension. In the analysis of the far-infrared reflection spectra, numerical model for calculating the reflectivity coefficient of layered system, which includes film with nanocrystallite inclusions (modeled by Maxwell–Garnet approximation) and substrate, has been applied. UV–VIS spectroscopy and photoluminescence spectroscopy are employed to estimate direct and indirect band gap of CuSe2.
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