卷积神经网络
人工智能
计算机科学
特征提取
过程(计算)
代表(政治)
机器学习
人工神经网络
深度学习
特征(语言学)
恒虚警率
特征学习
模式识别(心理学)
语言学
哲学
政治
政治学
法学
操作系统
作者
D. R. Weimer,Bernd Scholz‐Reiter,M. Shpitalni
出处
期刊:CIRP Annals
[Elsevier BV]
日期:2016-01-01
卷期号:65 (1): 417-420
被引量:533
标识
DOI:10.1016/j.cirp.2016.04.072
摘要
Abstract Fast and reliable industrial inspection is a main challenge in manufacturing scenarios. However, the defect detection performance is heavily dependent on manually defined features for defect representation. In this contribution, we investigate a new paradigm from machine learning, namely deep machine learning by examining design configurations of deep Convolutional Neural Networks (CNN) and the impact of different hyper-parameter settings towards the accuracy of defect detection results. In contrast to manually designed image processing solutions, deep CNN automatically generate powerful features by hierarchical learning strategies from massive amounts of training data with a minimum of human interaction or expert process knowledge. An application of the proposed method demonstrates excellent defect detection results with low false alarm rates.
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