补偿(心理学)
曲率
发电机(电路理论)
温度系数
阶段(地层学)
电压
电压基准
材料科学
偏压
控制理论(社会学)
物理
电气工程
数学
计算机科学
工程类
几何学
功率(物理)
热力学
复合材料
人工智能
古生物学
生物
控制(管理)
心理学
精神分析
作者
Mohammad Azimi,Mehdi Habibi,Paolo Crovetti
出处
期刊:Electronics
[Multidisciplinary Digital Publishing Institute]
日期:2024-04-07
卷期号:13 (7): 1390-1390
被引量:7
标识
DOI:10.3390/electronics13071390
摘要
Leakage diodes cause deviations in the thermal drift of ultra-low-power two-transistor (2T) reference circuits, resulting in either convex or concave output voltages against temperature, depending on the reference transistor types (n-type/p-type). This paper investigates the combined application of the convexity and concavity properties exhibited by the output voltage of complementary 2T references, one n-type and one p-type. By exploiting the body bias effect, this approach mitigates variations in the output reference voltage caused by temperature fluctuations. Software optimization is also used to obtain the required aspect ratios after formulating the required criteria for drain-induced barrier lowering (DIBL) elimination in the first stage. The performance of the proposed reference is evaluated by post-layout Monte Carlo simulations. In the range of 0 °C to 100 °C, the output reference voltage has an average temperature coefficient (TC) of 26.7 ppm/°C without any temperature trim. The output reference voltage is 195.5 mV with a standard deviation of 13.6 mV. The line sensitivity (LS) is 17.1 ppm/V in the supply voltage range of 0.5 V to 2.1 V at 25 °C. At 25 °C and 0.5 V, the power consumption is 28.8 pW, increasing to a maximum of 1.3 nW at 100 °C and 2.1 V.
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