斜面
材料科学
GSM演进的增强数据速率
肖特基二极管
肖特基势垒
光电子学
二极管
金属半导体结
梅萨
工程类
电信
结构工程
计算机科学
程序设计语言
作者
Nanling Sun,Hehe Gong,Tiancheng Hu,Feng Zhou,Zhengpeng Wang,Xinxin Yu,Fangfang Ren,Shulin Gu,Hai Lu,R. Zhang,Jiandong Ye
摘要
Power devices rely on ideal edge termination to suppress the electric field crowding and avoid premature breakdown before the material's critical field is reached. In this work, a hybrid electric field management configuration, featuring the combination of beveled-mesa (BM) termination and high-k oxide BaTiO3 field plate (FP), was implemented in Ga2O3 Schottky barrier diodes (SBDs). This BMFP-SBD realizes a breakdown voltage (BV) of 1.7 kV with extremely low reverse leakage current, outperforming the BM terminated SBD with BV of 0.64 kV and bare SBD with BV of 0.22 kV. Based on the temperature-dependent reverse characteristics, the dominant leakage mechanism transforms from Poole–Frenkel (P–F) emission in BM-SBD to variable-range-hopping (VRH) in BMFP-SBD at high bias. In particular, under switching conditions of di/dt up to 420 A/μs, the BMFP-SBD exhibits superior dynamic switching characteristics with a short reverse recovery time of 10.1 ns, which are comparable with those in advanced commercial SiC SBDs. These findings underscore the potential of Ga2O3 SBD enabled by BM and high-k FP edge termination for high-speed and high-voltage power electronics applications.
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