铪
哈夫尼亚
材料科学
硅
氧化物
电子结构
化学物理
锆
计算化学
光电子学
化学
复合材料
冶金
立方氧化锆
陶瓷
作者
Tzu-Ray Shan,Bryce D. Devine,Travis Kemper,Susan B. Sinnott,Simon R. Phillpot
出处
期刊:Physical Review B
[American Physical Society]
日期:2010-03-24
卷期号:81 (12)
被引量:144
标识
DOI:10.1103/physrevb.81.125328
摘要
A dynamic-charge, many-body potential function is proposed for the hafnium/hafnium oxide system. It is based on an extended Tersoff potential for semiconductors and the charge-optimized many-body potential for silicon oxide. The materials fidelity of the proposed formalism is demonstrated for both hafnium metal and various hafnia polymorphs. In particular, the correct orders of the experimentally observed polymorphs of both the metal and the oxide are obtained. Satisfactory agreement is found for the structural and mechanical properties, defect energetics, and phase stability as compared to first-principles calculations and/or experimental values. The potential can be used in conjunction with the previously determined potentials for the Si and ${\text{SiO}}_{2}$ system. This transferability is demonstrated by comparing the structure of a hafnia/silicon interface to that previously determined from electronic-structure calculations.
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