电阻随机存取存储器
材料科学
电极
光电子学
碳纳米管
非易失性存储器
电流密度
电阻式触摸屏
纳米技术
电气工程
量子力学
物理
工程类
物理化学
化学
作者
Yi Wu,Yang Chai,Hongyu Chen,Shimeng Yu,H.‐S. Philip Wong
摘要
We report the first AlOx-based resistive switching memory (RRAM) using carbon nanotubes (CNT) as contact electrodes. CNTs with average diameter of 1.2nm effectively localize the conduction filaments (CFs). The Al/AlOx/CNT device successfully switches over 104 cycles with less than 5µA programming current. Extreme scaling of the device down to 6nm×6nm is realized by the CNT/AlOx/CNT cross-point structure and 104 switching cycles are achieved. This work is the first step toward RRAM with nm-scale electrodes. It paves the way for future high density, low power non-volatile RRAM memory application.
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