接触印刷品
纳米线
薄脆饼
材料科学
纳米技术
转印
半导体
平版印刷术
光电子学
基质(水族馆)
硅
光刻
接触电阻
图层(电子)
复合材料
海洋学
地质学
作者
Zhiyong Fan,Johnny C. Ho,Zachery A. Jacobson,Roie Yerushalmi,Robert L. Alley,Haleh Razavi,Ali Javey
出处
期刊:Nano Letters
[American Chemical Society]
日期:2007-08-16
卷期号:8 (1): 20-25
被引量:578
摘要
Controlled and uniform assembly of "bottom-up" nanowire (NW) materials with high scalability presents one of the significant bottleneck challenges facing the integration of nanowires for electronic applications. Here, we demonstrate wafer-scale assembly of highly ordered, dense, and regular arrays of NWs with high uniformity and reproducibility through a simple contact printing process. The assembled NW pitch is shown to be readily modulated through the surface chemical treatment of the receiver substrate, with the highest density approaching approximately 8 NW/mum, approximately 95% directional alignment, and wafer-scale uniformity. Such fine control in the assembly is attained by applying a lubricant during the contact printing process which significantly minimizes the NW-NW mechanical interactions, therefore enabling well-controlled transfer of nanowires through surface chemical binding interactions. Furthermore, we demonstrate that our printing approach enables large-scale integration of NW arrays for various device structures on both rigid silicon and flexible plastic substrates, with a controlled semiconductor channel width ranging from a single NW ( approximately 10 nm) up to approximately 250 microm, consisting of a parallel array of over 1250 NWs and delivering over 1 mA of ON current.
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