原子探针
材料科学
图层(电子)
氧化物
奥氏体
钼
冶金
奥氏体不锈钢
Atom(片上系统)
合金
纳米
分析化学(期刊)
镍
腐蚀
复合材料
化学
微观结构
嵌入式系统
色谱法
计算机科学
作者
Stefan Monschein,Ronald Schnitzer,Rainer Fluch,Christoph Türk,Christian Höfer
出处
期刊:Practical Metallography
[De Gruyter]
日期:2021-05-01
卷期号:58 (5): 264-281
被引量:3
摘要
Abstract This work aimed at developing a methodology for examining the naturally grown passive layer of a thickness of just a few nanometers of an austenitic CrMnN steel by means of atom probe tomography and gaining knowledge on the structure of this alloy’s passive layer. The sample surface was ground, polished, cleaned, degreased, electrolytically polished, and oxidized in air to produce a reproducible passive layer. The oxide layer was subsequently coated with a silver layer of a thickness of 3 μm. The silver layer protects the oxide layer during the preparation of the atom probe tips in the focused ion beam microscope and the alignment of the tip in the atom probe. The samples were measured in the atom probe’s pulsed-voltage mode. The findings show that an enrichment of oxygen, molybdenum, nitrogen, and chromium and a depletion of manganese, nickel, and iron occur in the area of the passive layer.
科研通智能强力驱动
Strongly Powered by AbleSci AI