静态随机存取存储器
备用电源
架空(工程)
电压
晶体管
CMOS芯片
功率(物理)
电气工程
低压
计算机科学
电子工程
工程类
物理
量子力学
作者
Nobuaki Kobayashi,Tadayoshi Enomoto
标识
DOI:10.1587/transele.e101.c.822
摘要
We developed and applied a new circuit, called the “Self-controllable Voltage Level (SVL)” circuit, not only to expand both “write” and “read” stabilities, but also to achieve a low stand-by power and data holding capability in a single low power supply, 90-nm, 2-kbit, six-transistor CMOS SRAM. The SVL circuit can adaptively lower and higher the word-line voltages for a “read” and “write” operation, respectively. It can also adaptively lower and higher the memory cell supply voltages for the “write” and “hold” operations, and “read” operation, respectively. This paper focuses on the “hold” characteristics and the standby power dissipations (PST) of the developed SRAM. The average PST of the developed SRAM is only 0.984µW, namely, 9.57% of that (10.28µW) of the conventional SRAM at a supply voltage (VDD) of 1.0V. The data hold margin of the developed SRAM is 0.1839V and that of the conventional SRAM is 0.343V at the supply voltage of 1.0V. An area overhead of the SVL circuit is only 1.383% of the conventional SRAM.
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