材料科学
位错
结晶学
纳米
化学物理
纳米尺度
Crystal(编程语言)
纳米技术
部分位错
半导体
化学
光电子学
复合材料
计算机科学
程序设计语言
作者
Sang T. Pham,Natalia Koniuch,Emily Wynne,Andy Brown,Sean M. Collins
标识
DOI:10.1038/s41563-025-02138-5
摘要
Abstract Organic molecular crystals encompass a vast range of materials from pharmaceuticals to organic optoelectronics, proteins and waxes in biological and industrial settings. Crystal defects from grain boundaries to dislocations are known to play key roles in mechanisms of growth 1,2 and in the functional properties of molecular crystals 3–5 . In contrast to the precise analysis of individual defects in metals, ceramics and inorganic semiconductors enabled by electron microscopy, substantially greater ambiguity remains in the experimental determination of individual dislocation character and slip systems in molecular materials 3 . In large part, nanoscale dislocation analysis in molecular crystals has been hindered by the low electron doses required to avoid irreversibly degrading these crystals 6 . Here we present a low-dose, single-exposure approach enabling nanometre-resolved analysis of individual dislocations in molecular crystals. We demonstrate the approach for a range of crystal types to reveal dislocation character and operative slip systems unambiguously.
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