无损检测
微波食品加热
材料科学
微波成像
旋光法
声学
极化(电化学)
光学
涂层
涡流检测
结构工程
复合材料
散射
计算机科学
工程类
物理
电信
化学
物理化学
量子力学
作者
Mohammed Saif ur Rahman,Omar S. Hassan,Ademola Akeem Mustapha,Khaled Al-Wahedi,Mohamed Abou-Khousa
标识
DOI:10.1016/j.ndteint.2023.102958
摘要
Reliable detection of cracks on slanted metal surfaces and through irregular insulation/coating is critical in many inspection applications. Microwave non-destructive testing (NDT) techniques have proven to be effective for crack detection and characterization. However, the utility of conventional microwave NDT techniques for challenging inspection scenarios which involve cracks on slanted surfaces, or cracks under relatively thick, and possibly, irregular insulation has been limited. In this paper, a polarimetric microwave imaging approach is employed for the detection of cracks in such inspection cases. The detection concept using interrogation with dual polarized wave to suppress the background is presented. It is established herein that the cross-polarization measurement is independent to irregular surfaces, and therefore, it constitutes an effective mean for reliable crack detection even if the background is not uniform or if the metal surface is slanted. This fact is further corroborated by numerical electromagnetic simulations and measurements. The efficacy of the proposed method is demonstrated using imaging results of various samples spanning the abovementioned scenarios.
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