可靠性(半导体)
试验计划
采样(信号处理)
平面图(考古学)
可靠性工程
人口
验收抽样
计算机科学
失效模式及影响分析
统计
工程类
样本量测定
数学
地理
医学
环境卫生
滤波器(信号处理)
威布尔分布
考古
功率(物理)
物理
量子力学
计算机视觉
作者
Ji Hwan,Maxim Finkelstein
标识
DOI:10.1093/imaman/dpad010
摘要
Abstract Accepted by: Phil Scarf In practice, many engineering items have more than one failure mode, whereas most of the existing reliability acceptance sampling plans reported in the literature assume that they have only one basic failure mode. To fill the gap, in this paper, we propose a reliability sampling plan for items with an additional failure mode that is due to external shocks. Moreover, heterogeneous populations of items are considered when items’ lifetime distributions differ from subpopulation to subpopulation. A new two-stage reliability sampling plan that takes into account these factors has been developed, where the lifetimes of items in a population are stochastically compared before and after the acceptance test. It is shown that the developed sampling plan improves the reliability characteristic of the population.
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