Electrochemical Modeling of PID Leakage Current of PV Modules: Steady‐State Current, Transient Current, and RC‐Equivalent Circuit

ABSTRACT Potential‐induced degradation (PID) remains a significant reliability concern for photovoltaic (PV) modules, arising when a voltage difference between the module frame and the solar cells drives unintended leakage current through the glass–encapsulant stack. Although PID ultimately manifests as PID‐s, PID‐p, or PID‐c, the underlying behavior of the leakage current—its magnitude and time dependence—requires clearer electrochemical interpretation. Traditional explanations attribute the initial transient current to bulk capacitive elements of the glass, encapsulant, and antireflection coatings, and the steady‐state current according to their effective ohmic resistance. More recent studies, however, indicate that electrochemical charge‐transfer processes at the encapsulant–metallization interface can play a dominant role in defining the leakage‐current path. This paper develops a unified electrochemical framework for modeling PID leakage current. First, an RC‐equivalent circuit is formulated by combining conventional RC elements with a Randles‐type interface to capture transient leakage current through double‐layer capacitance and faradaic processes at ionic–electronic boundaries. Second, the steady‐state current–voltage behavior is explained using a linearized Butler–Volmer relationship, showing that the measured ohmic response corresponds to the low‐overpotential limit of charge‐transfer kinetics. Analytical results demonstrate that, for typical module materials—3.2‐mm soda‐lime glass and 0.45‐mm encapsulant—the dominant modulators to PID leakage current are the glass surface resistance (under dry‐surface conditions), the glass bulk capacitance, and the encapsulant resistance (under wet‐surface conditions), with soda lime glass surface and EVA/POE encapsulant resistances primarily governing steady‐state current. The proposed electrochemical model is validated against measured leakage‐current data, showing good agreement in both the magnitude and the time‐dependent evolution of PID leakage current.