A. Özgür,W. Kim,Zongjian Fan,A. Botchkarev,A. Salvador,S. Noor Mohammad,B. Sverdlov,H. Morkoç
出处
期刊:Electronics Letters [Institution of Engineering and Technology] 日期:1995-08-03卷期号:31 (16): 1389-1390被引量:141
标识
DOI:10.1049/el:19950921
摘要
Normally-off GaN based modulation doped field-effect transistors have been fabricated. The extrinsic transconductance of MODFETs with gate and channel lengths of 3 and 5 µm, respectively, is as high as 120 mS/mm. The devices exhibit 300 mA/mm current at a positive gate bias of 3 V. This transconductance value compares very favourably with the 45 mS/mm and 24 mS/mm reported earlier for 1 and 0.23 µm gate devices, respectively.