氚
核工程
聚变能
污染
氦
材料科学
机制(生物学)
融合
环境科学
核物理学
放射化学
原子物理学
等离子体
物理
化学
工程类
哲学
语言学
生态学
生物
量子力学
作者
Vinit Shukla,Vikas J. Lakhera,B. Sarkar
标识
DOI:10.1016/j.fusengdes.2019.05.014
摘要
The threat to cryogenic plant safety can be dependent on the extent of tritium contamination in the cryogenic helium circuit. There are some scenarios such as regeneration of cryopumps at high temperature e.g. 300 K and 470 K where tritium can handshake with cryogenic helium. The temperature and upstream partial pressure dependency on permeation are predicted in this paper. It has been found that permeation is dominant at temperatures over 300 K. The results also show that for 100 K regeneration of cryopumps there is no possibility of tritium contamination of the cryogenic helium circuit. However, for regeneration cycles at higher temperature i.e. 300 K and 470 K this can be a serious threat, considering partial or incomplete 100 K regeneration. The results predict that 60% or more efficient (which is easily achievable) 100 K regeneration is safe for complete 300 K regeneration cycles. But, to breach the safety cap i.e. 0.2 G Bq/annum or 5.6 × 10-7 gm/annum, even 11.2 mPa of tritium partial pressure at 470 K will take only 8 regeneration cycles to breach the safety limit of tritium in cryogenic helium. The paper also defines the allowable partial pressure of tritium at 300 K and 470 K regenerations required to avoid any tritium contamination to the cryogenic helium circuit.
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