电容器
沟槽
电子线路
去耦电容器
无线电频率
计算机科学
电子工程
表征(材料科学)
电气工程
材料科学
工程类
纳米技术
电压
电信
图层(电子)
作者
Kevni Büyüktas,Angelika Geiselbrechtinger,Stefan Decker,Klaus Koller
标识
DOI:10.1088/0268-1242/24/7/075007
摘要
The necessity for exact modelling and simulation data of the electrical characteristics of passive on-chip devices has become more and more important. The electrical performance of RF circuits is predominantly restricted by the passives. In this work the RF simulation and characterization for a new trench capacitor in a low loss environment are presented for the first time. The excellent accordance of the modelling data with the measured RF characteristics of this so-called SilCap (silicon capacitor) is shown. An analytical model has been developed which permits the exact circuit simulation of all relevant electrical quantities. The device simulation enables the optimization of the SilCap device geometries.
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