X射线光电子能谱
扫描隧道显微镜
离解(化学)
氧化铈
氢
密度泛函理论
氧化物
解吸
氧气
光电发射光谱学
材料科学
热脱附
热脱附光谱法
铈
分析化学(期刊)
化学物理
原子单位
化学
物理化学
无机化学
吸附
纳米技术
化学工程
计算化学
有机化学
工程类
冶金
物理
色谱法
量子力学
作者
Avinash Vikatakavi,Stefania Benedetti,Giulia Righi,Rita Magri,Sergio D’Addato,P. Luches,Annabella Selloni
标识
DOI:10.1021/acs.jpcc.2c04442
摘要
High Resolution Image Download MS PowerPoint Slide We investigate the interaction between molecular hydrogen and ultrathin epitaxial CeO 2 films modified with a 2% concentration of Cu atoms using X-ray photoemission spectroscopy (XPS) during thermal reduction cycles in H 2 . The XPS measurements are combined with density functional theory calculations to obtain further insight into the observed modifications of the film surface. Our results show that the presence of Cu atoms decreases the barrier for H 2 dissociation in comparison to that on pure ceria surfaces, leading to the formation of surface OH groups after exposure to H 2 . Moreover, surface oxygen vacancies are generated already at mild temperatures (470 K), most likely via water formation and desorption. The presence of surface oxygen vacancies and hydroxyls contributes to the observed large increase in surface Ce 3+ concentration with increasing reduction temperature. In spite of these atomic scale modifications, the surface morphology observed by scanning tunneling microscopy remains substantially unchanged on the length scale of tens of nm.
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