Tutorial on non-contact electrical characterisation of low-dimensional materials via ultrafast terahertz spectroscopy and microscopy. This tutorial begins with the basic operation of ultrafast terahertz time-domain and time-resolved terahertz spectroscopy systems and their application to characterisation of low-dimensional materials, such as semiconductor nanowires. It then extends to emerging techniques, such as near-field terahertz microscopy, for employing these techniques on nanoscale length scales.