吸收(声学)
分析化学(期刊)
材料科学
物理
化学
光学
色谱法
作者
Gangadhar Das,A. G. Karydas,Haranath Ghosh,Mateusz Czyżycki,Alessandro Migliori,A. K. Sinha,M. K. Tiwari
出处
期刊:Physical review
日期:2017-10-24
卷期号:96 (15)
被引量:4
标识
DOI:10.1103/physrevb.96.155444
摘要
We report results of simultaneous x-ray reflectivity and grazing incidence x-ray fluorescence measurements in combination with x-ray standing-wave-assisted depth-resolved near-edge x-ray absorption measurements to reveal new insights on chemical speciation of W in a ${\text{W-B}}_{4}\mathrm{C}$ multilayer structure. Interestingly, our results show the existence of various unusual electronic states for the W atoms especially those near to the surface and interface boundary of a thin film medium as compared to those of the bulk. These observations are found to be consistent with the results obtained using first-principles calculations. Unlike the conventional x-ray absorption measurements the present approach has an advantage that it permits the determination of the depth-resolved chemical nature of an element in the thin-layered materials at atomic length scale resolution.
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