Reliability testing for silicon photonics and optoelectronics (Invited)

After a brief introduction of major categories of optoelectronic devices that will be covered, we'll start by discussing the main reliability problems that have been encountered in fielded deployment, that we wish to test for. Then we'll talk about testing at subcomponent and component levels, and different test platforms, as well as how the methods differ from those used in electronic reliability testing. We close with future challenges, and proposals for how to address them.