光探测
双模
材料科学
对偶(语法数字)
模式(计算机接口)
光电子学
光学
物理
光电探测器
计算机科学
工程类
电子工程
操作系统
文学类
艺术
作者
Huimin Yang,Xiaoming Mo,Wangbing Xiong,Kailian Dong,Yulu Zhou,Xiaoma Tao,Yifang Ouyang,Jialong Zhao,Guojia Fang
出处
期刊:ACS Nano
[American Chemical Society]
日期:2024-12-01
卷期号:18 (49): 33643-33652
被引量:11
标识
DOI:10.1021/acsnano.4c12474
摘要
Ultraviolet photodetectors (UV PDs) based on microcrystals (MCs) have attracted extensive attention due to their outstanding detection performance. Nevertheless, precise manipulation of the MCs still remains challenging, which may hinder the mass processing and performance improvement of the UV PDs. In this work, a single high-quality Cs 3 Cu 2 I 5 MC that had a special X-shaped morphology was demonstrated to be successfully manipulated to prepare high-performance UV PDs by virtue of optical focusing, probe micromanipulation, and direct-write photolithography techniques. The UV PDs, prepared on the counter limbs and adjacent limbs of the single X-shaped Cs 3 Cu 2 I 5 MC, exhibited distinctly different dual-mode photoresponse under 254 nm UVC and 310 nm UVB irradiations. At light intensity as low as 2.59 μW/cm 2, the counter electrode and adjacent electrode UV PDs showed quite a high responsivity of up to 3376 A/W, a specific detectivity of up to 2.37 × 10 14 Jones, and an on/off ratio of up to 1.79 × 10 2 at a bias voltage of 5 V. Besides, even after 28,800 s (8 h) of continuous operation under dual-mode UV irradiations at 254 and 310 nm, the unpackaged device showed extraordinary stability in the photocurrents in ambient air. Our findings provide inspiration for preparing high-performance dual-mode UV PDs based on the microscale perovskite-inspired copper halides or other semiconductor MCs.
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